LFoundry will join JMP DISCOVERY SUMMIT EUROPE in Frankfurt
14-15 March 2018.
The JMP Discovery
Summit Series is the living, breathing version of JMP software: interactive,
dynamic, and visual. Each Summit brings together world-renowned thought
leaders, JMP experts, and business leaders from many industries to exchange
best practices in data exploration, and play with both new and proven
statistical techniques.
Gianpaolo Polsinelli, Senior Data Mining Engineer at
LFoundry and Felice Russo, PCM & Yield Data MGNT Senior Manager
will present a Poster entitled:
Data Mining for asymmetric data set under the curse of
dimensionality
Find in big and noisy data set the most influential yield
predictors in a Semiconductor Fab.
Poster introduction:
In Semiconductor manufacturing is one of the most
technologically and highly complicated manufacturing processes. Because of high
number of process steps and the high number of sensors this industry is facing
a huge torrent of data. In addition to the large number of production data, the
unbalance of pass and failing parts make this dataset difficult to analyze
With a so high number of data the standard technique of one
variable at the time could fail because of the influence of a large number of manufacturing
variables.
Data by itself isn’t useful. To be useful it must be
converted into actionable information to drive yield and product quality
improvement.
Here comes the Machine Learning (ML).
In order to avoid model over-fitting issue the reduction of
sample dimensionality is needed too. In other words to increase the
signal-noise ratio of available data we need to reduce the feature number
before apply any ML model. Once the interesting patterns have been extracted
from database, they will be validate by experience of engineer.